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Visoria P Polarization Microscope for Geosciences Including Conoscopy with Flexacam c5

Leic Microsystems Visoria P Objective Image2

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VisoriaP Polarization Stage Kid21777036

Visoria P Light Management Clip LQ Kid21777013

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Experience enhanced efficiency and comfort in your daily microscopy routine. The Visoria P polarization microscope uses polarized light to study the optical properties of materials and geological samples.

Streamline your workflows with encoded functions, optimized light settings, and other microscope features. You can also be more comfortable and minimize strain thanks to the microscope’s ergonomic design.

This configuration includes the Visoria P polarization microscope as well as Flexacam c5 microscope camera and is suited for geosciences applications (incl. Conoscopy)

  • Visoria P Polarization microscope with illumination management
  • Binocular phototube
  • Two eyepieces (10x), field of view 22 mm, thereof one with cross hair reticule
  • Flexacam c5 microscope camera, incl. c-mount 0.55x
  • High-power white LED
  • Contrast methods (transmitted light): Quantitative polarization, Brightfield
  • Encoded nosepiece, 5x
  • Objectives (N PLAN POL): 5x, 10x, 20x, 40x, 63x
  • 360° rotatable polarization stage with verniers, 45° clickstop position and brake
  • Object guide without point counting
  • 360° analyzer, Polarizer, Whole-wave plate f. compensator slot
  • Bertrand lens cube
  • 3-step focus drive with height-adjustable focus knobs
  • Enersight microscope software
  • Dust protection cover
  • Quick start guide and user manual
Technical Specification
Contrasting Method(s) Brightfield, Qualitative Polarization
Long Working Distance Optional
Microscope Stage Type(s) Manual
Microscope Camera Option(s) Single Camera
Microscopy Software Available 3D Visualization, Documentation, Measuring, Tile Stitching
Has Eyepiece Yes
Microscope Type(s) Upright Microscope, Light Microscope
Maximum Optical Magnification (x times) 630
Bertrand lens cube, fixed

Bertrand lens cube, fixed

11555083

1

QTY

C-Mount HC 0.55x

C-Mount HC 0.55x

11541544

1

QTY

Flexacam c5

Flexacam c5

12730535

1

QTY

Visoria P

Visoria P

11561615

1

QTY

Focus drive 3-step

Focus drive 3-step

11561605

1

QTY

Ground plate

Ground plate

11561609

1

QTY

Lamp housing  LH113 LED

Lamp housing LH113 LED

11504199

1

QTY

Focus knobs for Visoria

Focus knobs for Visoria

11561608

1

QTY

Tube  HC L1TP 4/5/7, binoc. phototube

Tube HC L1TP 4/5/7, binoc. phototube

11551506

1

QTY

Eyepiece HC PLAN s 10x/22 Br.M +reticule

Eyepiece HC PLAN s 10x/22 Br.M +reticule

11557807

1

QTY

Eyepiece HC PLAN s 10x/22 Br. M

Eyepiece HC PLAN s 10x/22 Br. M

11507820

1

QTY

Pol rotating stage 45° with clamp

Pol rotating stage 45° with clamp

11551079

1

QTY

Object Guide without Point Counting

Object Guide without Point Counting

13613661

1

QTY

Analyzer360°, 30x5 with grey filter

Analyzer360°, 30x5 with grey filter

11555080

1

QTY

Condenser achr.-apl. A 0.9 (P), CC

Condenser achr.-apl. A 0.9 (P), CC

11501183

1

QTY

Polarizer L ICT/P

Polarizer L ICT/P

11555034

1

QTY

Whole-wave plate f. compensator slot

Whole-wave plate f. compensator slot

11553388

1

QTY

Dust cover DML/Visoria/3000 Fluo/Photo

Dust cover DML/Visoria/3000 Fluo/Photo

11501074

1

QTY

Microscope Objective N PLAN 63x/0,80 POL

Microscope Objective N PLAN 63x/0,80 POL

11556056

1

QTY

Microscope Objective N PLAN EPI 5x/0,12 POL

Microscope Objective N PLAN EPI 5x/0,12 POL

11556075

1

QTY

Microscope Objective N PLAN EPI 10x/0,25 POL

Microscope Objective N PLAN EPI 10x/0,25 POL

11556517

1

QTY

Microscope Objective N PLAN 20x/0,40 POL

Microscope Objective N PLAN 20x/0,40 POL

11556083

1

QTY

Microscope Objective N PLAN 40x/0,65 POL

Microscope Objective N PLAN 40x/0,65 POL

11556084

1

QTY

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Enersight XY Stitching
Software

Enersight XY Stitching

Enersight XY Stitching

Enersight Extended Depth of Field (EDOF)
Software

Enersight Extended Depth of Field (EDOF)

Acquire sharp images of your sample with extended depth of field (EDOF). It involves the vertical Z movement of the sample to capture in-focus image information

Enersight Layer Thickness
Software

Enersight Layer Thickness

Acquire sharp images of your sample with extended depth of field (EDOF). It involves the vertical Z movement of the sample to capture in-focus image information