Visoria P Polarization Microscope for Geosciences Including Conoscopy with Flexacam c5
Experience enhanced efficiency and comfort in your daily microscopy routine. The Visoria P polarization microscope uses polarized light to study the optical properties of materials and geological samples.
Streamline your workflows with encoded functions, optimized light settings, and other microscope features. You can also be more comfortable and minimize strain thanks to the microscope’s ergonomic design.
This configuration includes the Visoria P polarization microscope as well as Flexacam c5 microscope camera and is suited for geosciences applications (incl. Conoscopy)
- Visoria P Polarization microscope with illumination management
- Binocular phototube
- Two eyepieces (10x), field of view 22 mm, thereof one with cross hair reticule
- Flexacam c5 microscope camera, incl. c-mount 0.55x
- High-power white LED
- Contrast methods (transmitted light): Quantitative polarization, Brightfield
- Encoded nosepiece, 5x
- Objectives (N PLAN POL): 5x, 10x, 20x, 40x, 63x
- 360° rotatable polarization stage with verniers, 45° clickstop position and brake Object guide without point counting
- 360° analyzer, Polarizer, Whole-wave plate f. compensator slot
- Bertrand lens cube
- 3-step focus drive with height-adjustable focus knobs
- Enersight microscope software
- Dust protection cover
- Quick start guide and user manual
| Contrasting Method(s) | Brightfield, Qualitative Polarization |
| Long Working Distance | Optional |
| Microscope Stage Type(s) | Manual |
| Microscope Camera Option(s) | Single Camera |
| Microscopy Software Available | 3D Visualization, Documentation, Measuring, Tile Stitching |
| Has Eyepiece | Yes |
| Microscope Type(s) | Upright Microscope, Light Microscope |
| Maximum Optical Magnification (x times) | 630 |
Bertrand lens cube, fixed
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C-Mount HC 0.55x
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Flexacam c5
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Visoria P
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Focus drive 3-step
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Ground plate
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Lamp housing LH113 LED
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Focus knobs for Visoria
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Tube HC L1TP 4/5/7, binoc. phototube
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Eyepiece HC PLAN s 10x/22 Br.M +reticule
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Eyepiece HC PLAN s 10x/22 Br. M
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Pol rotating stage 45° with clamp
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Object Guide without Point Counting
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Analyzer360°, 30x5 with grey filter
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Condenser achr.-apl. A 0.9 (P), CC
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Polarizer L ICT/P
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Whole-wave plate f. compensator slot
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Dust cover DML/Visoria/3000 Fluo/Photo
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Microscope Objective N PLAN 63x/0,80 POL
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Microscope Objective N PLAN EPI 5x/0,12 POL
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Microscope Objective N PLAN EPI 10x/0,25 POL
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Microscope Objective N PLAN 20x/0,40 POL
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Microscope Objective N PLAN 40x/0,65 POL
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Enersight Extended Depth of Field (EDOF)
Acquire sharp images of your sample with extended depth of field (EDOF). It involves the vertical Z movement of the sample to capture in-focus image information
Enersight Layer Thickness
Acquire sharp images of your sample with extended depth of field (EDOF). It involves the vertical Z movement of the sample to capture in-focus image information